Surface polishing method application to reduce micotoxin content of mill wheat339-342Views:137
The fungi causing the infection and most of the harmful toxins they produce are concentrated in the bran of the grain, thus the intensive surface cleaning, the so-called debranning operation could allow the reduction of contamination in the milling technology. The essence of the PeriTec technology – originally developed by SATAKE, a Japanese company, to clean rice – is that it gradually removes the bran layers of the grain by mechanical means before further processing. We modeled the PeriTec technology with a laboratory size, batch-operating, horizontal debranning machine by SATAKE. The flour, milled grain after grinding 40 sec, the initial toxin content was only a small proportion (~15–20%) measured. The results showed that below the limit of DON toxin contaminated wheat (DON: 1.15 mg kg-1) during the grinding surface of the detached bran toxin contamination shows a very high (6.16 mg kg-1). The 40 seconds debranning before grinding shows lower DON toxin content than without debranning. So it is importance before the grinding. The toxin contamination of the bran fractions is significantly reduced, which is importance to the feeding point. As a result of debranning, the toxin content of the grinding fractions decreased, which justifies that that PeriTec method is suitable for the reduction of toxin contamination.
Wheat cleaning and milling technologies to reduce DON toxin contamination89-95Views:163
Mycotoxicosis caused by Fusarium fungi holds a huge risk considering economic and food safety issues worldwide. By applying milling technologies, we attempted to reduce the concentrates of DON toxin, as it is the most often found toxin in wheat.
The processes of sieving, aspiration and combination had been used on wheat with high DON toxin concentration. As a next step, grains were sorted using a horizontal cylinder separator, assorted by an optical and a gravity separator, and finally, the products were scoured and ground. The contamination level of the wheat and flour samples were defined by the HPLC-MS method.
Regarding the results, it can be stated that toxin concentration was most effectively reduced by optical separation and scouring, and by applying these milling techniques, food safety can be increased significantly.
Effects of agrotechnical factors on the quality and quantity of yield in winter wheat production69-75Views:137
The present study was conducted to determine the effect of basic agrotechnical factors on the yield and quality of winter wheat. Two experiments were set in 2017/2018 growing season, where we studied the influence of different forecrops, fertilizing treatments and cultivars. 204 samples were measured with Single Kernel Characterization System and NIR grain analyser to determine protein (NIR-P), wet gluten (NIR-WG), Hardness Index (HI), kernel weight (KW) and kernel diameter (KD). Fertilizing had a significant effect on yield, KW, HI, NIR-P and NIR-WG, except KD. N90PK dosage was enough to realize yield potential for 6 out of 9 cultivars, but considering protein content N150PK dosage was needed. The forecrop had no significant influence on yield, KW, KD or HI, however sweet corn as previous crop had significant improving effect on NIR-P and NIR-WG compared to sunflower as forecrop. According to our data of correlation analysis, no negative relationship was found between yield and NIR-P, however HI was in medium positive correlation with NIR-P. The variety Vyckor had the highest yield, but in quality aspect, the highest NIR-P and NIR-WG values belonged to KG Kunhalom variety.