No. 49 (2012)
Articles

Surface polishing method application to reduce micotoxin content of mill wheat

Published November 13, 2012
Antal Véha
Szegedi Tudományegyetem Mérnöki Kar, Szeged
P. Balázs Szabó
Szegedi Tudományegyetem Mérnöki Kar, Szeged
Ernő Gyimes
Szegedi Tudományegyetem Mérnöki Kar, Szeged
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APA

Véha, A., Szabó, P. B., & Gyimes, E. (2012). Surface polishing method application to reduce micotoxin content of mill wheat. Acta Agraria Debreceniensis, (49), 339-342. https://doi.org/10.34101/actaagrar/49/2555

The fungi causing the infection and most of the harmful toxins they produce are concentrated in the bran of the grain, thus the intensive surface cleaning, the so-called debranning operation could allow the reduction of contamination in the milling technology. The essence of the PeriTec technology – originally developed by SATAKE, a Japanese company, to clean rice – is that it gradually removes the bran layers of the grain by mechanical means before further processing. We modeled the PeriTec technology with a laboratory size, batch-operating, horizontal debranning machine by SATAKE. The flour, milled grain after grinding 40 sec, the initial toxin content was only a small proportion (~15–20%) measured. The results showed that below the limit of DON toxin contaminated wheat (DON: 1.15 mg kg-1) during the grinding surface of the detached bran toxin contamination shows a very high (6.16 mg kg-1). The 40 seconds debranning before grinding shows lower DON toxin content than without debranning. So it is importance before the grinding. The toxin contamination of the bran fractions is significantly reduced, which is importance to the feeding point.  As a result of debranning, the toxin content of the grinding fractions decreased, which justifies that that PeriTec method is suitable for the reduction of toxin contamination. 

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